The XPS-SEM Workflow webinar is available on-demand

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작성자 한국입자분석연구소 댓글 0건 조회 756회 작성일 23-01-11 12:44


Thermo fisherSCIENTIFIC의 XPS 장비와SEM 장비가 결합하여 다양한 분석이 가능한 분석법을 출시하였습니다. 

자세한 내용은 webinar를 통하여 체험하실 수 있으니 많은 참여 바랍니다.


Thermo Scientific
Harness the combined powers of SEM and XPS
Available on-demand: the CISA workflow demonstration
In this on-demand demonstration session you can witness the benefits of combining the powers of scanning electron microscopy (SEM) and X-ray photoelectron spectroscopy (XPS) firsthand.
You can now easily target the exact point-of-interest when transferring the sample between systems, guaranteeing better data correlation between XPS and SEM tools for more comprehensive surface analysis. Attend the webinar to learn more about:
Transferring the sample to the SEM to get high resolution imaging of the same positions
Analyzing points of interest with XPS to identify and quantify the surface chemistry
Combining everything in Maps software to have a complete view of the sample
 Watch on-demand 
CISA Workflow on the web
Learn more about the advantages of combining SEM and XPS for materials science research. You can now explore additional content such as an infographic or an eBook explaining the workflow based on different research applications.
 Visit website 
Get in touch
Would you like to talk to us about the CISA Workflow? Do you have questions, or do you need any assistance? Speak with one of our specialists.
 Contact us 

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