Available on-demand: the CISA workflow demonstration
In this on-demand demonstration session you can witness the benefits of combining the powers of scanning electron microscopy (SEM) and X-ray photoelectron spectroscopy (XPS) firsthand.
You can now easily target the exact point-of-interest when transferring the sample between systems, guaranteeing better data correlation between XPS and SEM tools for more comprehensive surface analysis. Attend the webinar to learn more about:
|•||Transferring the sample to the SEM to get high resolution imaging of the same positions|
|•||Analyzing points of interest with XPS to identify and quantify the surface chemistry|
|•||Combining everything in Maps software to have a complete view of the sample|
CISA Workflow on the web
Learn more about the advantages of combining SEM and XPS for materials science research. You can now explore additional content such as an infographic or an eBook explaining the workflow based on different research applications.
Get in touch
Would you like to talk to us about the CISA Workflow? Do you have questions, or do you need any assistance? Speak with one of our specialists.
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